کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
1536713 | 996573 | 2012 | 6 صفحه PDF | دانلود رایگان |
![عکس صفحه اول مقاله: A fast and accurate gamma correction based on Fourier spectrum analysis for digital fringe projection profilometry A fast and accurate gamma correction based on Fourier spectrum analysis for digital fringe projection profilometry](/preview/png/1536713.png)
In digital fringe projection profilometry, the gamma effect of the used electronic devices seriously affects the accuracy of three-dimensional (3D) topography measurements. Previous gamma correction methods do not take full advantage of the Fourier spectrum of the captured spatial-carrier phase-shifting fringe patterns. Hence, dozens of phase-shifting fringe patterns are required to carry out gamma pre-calibration. In this paper, a fast and accurate gamma correction technique based on a Fourier spectrum analysis is proposed. Only two spatial-carrier fringe patterns with different pre-encoded gamma values are needed and the number of fringe patterns required for gamma pre-calibration is significantly reduced without loss of accuracy. The proposed method is validated by experiments.
Journal: Optics Communications - Volume 285, Issue 5, 1 March 2012, Pages 533–538