کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
1538254 | 996607 | 2008 | 4 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
The analysis of ray aberration of arbitrary phase mask in the wavefront coding system
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موضوعات مرتبط
مهندسی و علوم پایه
مهندسی مواد
مواد الکترونیکی، نوری و مغناطیسی
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چکیده انگلیسی
The analyses of the imaging performance of the wavefront coding system are always based on the Fourier optics. In this paper, geometrical optics is used to analyze the imaging characteristics of arbitrary phase mask in the wavefront coding system. The characteristics of the spot diagrams created by odd and even symmetrical phase masks, including the size, upper and lower boundaries, ray structure, and the stability, are analyzed by the ray aberration theory. These characteristics are also compared with those obtained by Fourier optics, and the two sets of characteristics are proved to be consistent with each other quite well.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Optics Communications - Volume 281, Issue 18, 15 September 2008, Pages 4577–4580
Journal: Optics Communications - Volume 281, Issue 18, 15 September 2008, Pages 4577–4580
نویسندگان
Weiwei Huang, Zi Ye, Wenzi Zhang, Tingyu Zhao, Feihong Yu,