Simple optoelectronic method for analysis of transverse mode structure of lasers

Laser beam quality evaluation is generally carried out through the measurement of the M2 second-moment. This standard procedure is time consuming and is difficult to be implemented for checking, for instance, each VCSEL diode moving out of the assembly line of a high volume production factory. In this paper, we propose an alternative fast method allowing to distinguish easily a single transverse mode from a multiple transverse mode behaviour. This method is based on an electronic analysis (locking amplifier) of the local slope of the output laser characteristic, i.e. laser output power versus pumping.