Mueller matrix determination for one-dimensional rough surfaces: Four reduced measurement equivalent sets

There are several methods for the experimental determination of the Mueller matrix (MM) for a general scattering system. For the case of scattering in the plane-of-incidence, we apply the direct method of Mueller matrix ellipsometry to determine the MM associated to a one-dimensional scattering system. We show the MM for a 1-D surface can be determined with four different measurements from four equivalent sets consisting of four Stokes vector inputs and four analyzers. We show all the possible measurements can be reduced to a single set of four different intensity measurements.