Complete determination of the conical Mueller matrix for one-dimensional rough metallic surfaces

We present results of the complete determination of the Mueller matrix for the light scattered by a one-dimensional random rough metallic surface under a conical or out-the-plane of incidence geometry. We present and apply a reduced method for its complete determination. This reduced method considers only 16 intensity-polarized measurements instead of the 36 intensity-polarized measurements recently reported. Effects related with the enhanced backscattering were observed.