کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
1555361 | 999033 | 2015 | 10 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Advanced techniques for characterization of ion beam modified materials
ترجمه فارسی عنوان
تکنیک های پیشرفته برای مشخص کردن مواد اصلاح شده یون پرتو
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کلمات کلیدی
Rutherford Backscattering Spectrometry - اسپکترومتری بکار بردن رادرفوردIon beam modification - اصلاح یون پرتوRaman spectroscopy - طیف سنجی رامانPositron annihilation spectroscopy - طیف سنجی نابودی PositronX-ray diffraction - پراش اشعه ایکسSmall-angle X-ray scattering - پراکندگی اشعه ایکس با زاویه کوچک
موضوعات مرتبط
مهندسی و علوم پایه
مهندسی مواد
شیمی مواد
چکیده انگلیسی
Understanding the mechanisms of damage formation in materials irradiated with energetic ions is essential for the field of ion-beam materials modification and engineering. Utilizing incident ions, electrons, photons, and positrons, various analysis techniques, including Rutherford backscattering spectrometry (RBS), electron RBS, Raman spectroscopy, high-resolution X-ray diffraction, small-angle X-ray scattering, and positron annihilation spectroscopy, are routinely used or gaining increasing attention in characterizing ion beam modified materials. The distinctive information, recent developments, and some perspectives in these techniques are reviewed. Applications of these techniques are discussed to demonstrate their unique ability for studying ion-solid interactions and the corresponding radiation effects in modified depths ranging from a few nm to a few tens of μm, and to provide information on electronic and atomic structure of the materials, defect configuration and concentration, as well as phase stability, amorphization and recrystallization processes. Such knowledge contributes to our fundamental understanding over a wide range of extreme conditions essential for enhancing material performance and also for design and synthesis of new materials to address a broad variety of future energy applications.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Current Opinion in Solid State and Materials Science - Volume 19, Issue 1, February 2015, Pages 19-28
Journal: Current Opinion in Solid State and Materials Science - Volume 19, Issue 1, February 2015, Pages 19-28
نویسندگان
Yanwen Zhang, Aurélien Debelle, Alexandre Boulle, Patrick Kluth, Filip Tuomisto,