Keywords: اسپکترومتری بکار بردن رادرفورد; Nickel-Bismuth; Islands; Nanowires; Electron beam evaporation; Rutherford backscattering spectrometry; X-ray diffraction; Scanning electron microscope;
مقالات ISI اسپکترومتری بکار بردن رادرفورد (ترجمه نشده)
مقالات زیر هنوز به فارسی ترجمه نشده اند.
در صورتی که به ترجمه آماده هر یک از مقالات زیر نیاز داشته باشید، می توانید سفارش دهید تا مترجمان با تجربه این مجموعه در اسرع وقت آن را برای شما ترجمه نمایند.
در صورتی که به ترجمه آماده هر یک از مقالات زیر نیاز داشته باشید، می توانید سفارش دهید تا مترجمان با تجربه این مجموعه در اسرع وقت آن را برای شما ترجمه نمایند.
Keywords: اسپکترومتری بکار بردن رادرفورد; Rutherford backscattering spectrometry; Automation; Two dimensional analysis;
Keywords: اسپکترومتری بکار بردن رادرفورد; Metal-organic frameworks; Rutherford Backscattering Spectrometry;
Keywords: اسپکترومتری بکار بردن رادرفورد; MHD; Magnetohydrodynamics; TFTR; Tokamak Fusion Test Reactor; Elms; Edge-Localized Modes; TAE; Toroidal Alfven Eigenmode; RBS; Rutherford backscattering spectrometry; Ionoluminescence; Scintillators materials; Absolute efficiency; Degradation; Decay time;
Keywords: اسپکترومتری بکار بردن رادرفورد; Optical emission spectroscopy; Magnetron sputtering; Rutherford backscattering spectrometry; Gas pressure; Power density; Average deposition rate;
Keywords: اسپکترومتری بکار بردن رادرفورد; Ã
; Angstrom; AFM; atomic force microscopy; AMBER; Assisted Model Building and Energy Refinement R. Salomon-Ferrer, D.A. Case, R.C. Walker, An overview of the Amber biomolecular simulation package, WIREs Comput. Mol. Sci. 3 (2012) 198-210; BSA; Bovine s
Keywords: اسپکترومتری بکار بردن رادرفورد; Lithium-6 enriched glass; Diffusion coefficient; Activation energy; Fick’s second law; Rutherford backscattering spectrometry
Keywords: اسپکترومتری بکار بردن رادرفورد; Graphene; Hydrogen; Water; Absorption; Desorption; Nuclear reaction analysis; Elastic recoil detection; Rutherford backscattering spectrometry;
Keywords: اسپکترومتری بکار بردن رادرفورد; Magnetron sputtering; Thin films; Mechanical properties; Rutherford backscattering spectrometry; Hafnium oxide
Keywords: اسپکترومتری بکار بردن رادرفورد; Endotaxy; Embedded Ag nanostructures; Buried interfaces; Electron microscopy; Rutherford backscattering spectrometry; SERS substrates; Crystal Violet;
Keywords: اسپکترومتری بکار بردن رادرفورد; Ag nanoparticle; Localized surface plasmon resonance; Ar plasma exposure; Silver sulphide; Reduction of Ag2S; Rutherford backscattering spectrometry; Particle induced X-ray emission; X-ray photoelectron spectroscopy; Mie theory; Atomic force microscope;
Keywords: اسپکترومتری بکار بردن رادرفورد; Titanite; Diffusion; Niobium; Tantalum; Rutherford Backscattering Spectrometry
Keywords: اسپکترومتری بکار بردن رادرفورد; Uranium dioxide; Helium; Lattice location; Nuclear reaction analysis; Rutherford backscattering spectrometry; Interstitial octahedral site; Monte-Carlo simulation;
Keywords: اسپکترومتری بکار بردن رادرفورد; Thin films; Evaporation; Rutherford backscattering spectrometry; Optical properties
Keywords: اسپکترومتری بکار بردن رادرفورد; Self-assembly; Layer-by-layer; Surface roughness; Scanning probe microscopy; Rutherford backscattering spectrometry;
Keywords: اسپکترومتری بکار بردن رادرفورد; Rutherford backscattering spectrometry; Raman spectroscopy; X-ray diffraction; Small-angle X-ray scattering; Positron annihilation spectroscopy; Ion beam modification;
Keywords: اسپکترومتری بکار بردن رادرفورد; BM; Bending magnet; CT; Computed tomography; EDX; Energy-dispersive X-ray spectroscopy; EELS; Electron energy-loss spectroscopy; FT-IR; Fourier-transform infrared spectroscopy; IBA; Ion beam analysis; LA-ICP-OES/MS; Laser-ablation inductively-coupled plas
Keywords: اسپکترومتری بکار بردن رادرفورد; Cathodic arc evaporation; Metal ion etching; Sputtering; Coating; Rutherford backscattering spectrometry; TRIDYN;
Keywords: اسپکترومتری بکار بردن رادرفورد; Compression plasma flows; Iron oxides; Iron scale; Surface cleaning; X-ray diffraction; Rutherford backscattering spectrometry;
Keywords: اسپکترومتری بکار بردن رادرفورد; Rutherford backscattering spectrometry; Forward scattering; Heavy ion; Multiple scattering; Plural scattering; Monte Carlo;
Keywords: اسپکترومتری بکار بردن رادرفورد; Nuclear reaction analysis; Rutherford backscattering spectrometry; Erosion; Plasma facing surfaces; Plasma materials interactions; Depth profiling;
Keywords: اسپکترومتری بکار بردن رادرفورد; Membrane; Fouling; Silica; Rutherford backscattering spectrometry; X-ray photoelectron spectroscopy
Influence of Mg ion concentration in ZrO2 gate dielectric layered silicon based MOS capacitors for memory applications: Thorough understanding of conduction processes
Keywords: اسپکترومتری بکار بردن رادرفورد; Tetragonal phase stabilized ZrO2; High-κ based MOS capacitors; Electron beam evaporation; Rutherford backscattering spectrometry; Atomic force microscopy;
Heavy doping of CdTe single crystals by Cr ion implantation
Keywords: اسپکترومتری بکار بردن رادرفورد; CdTe; Ion implantation; Doping; Irradiation-induced damage; Rutherford backscattering spectrometry; Secondary ion mass spectrometry;
Electrode de-wetting as a failure mechanism in thermally-aged OPV devices
Keywords: اسپکترومتری بکار بردن رادرفورد; Organic photovoltaic; Electrode; Degradation; Stability; Rutherford backscattering spectrometry; Inverted architecture;
Thermal diffusion of mixed valence Ce in 6Li loaded silicate glass for neutron imaging
Keywords: اسپکترومتری بکار بردن رادرفورد; Cerium; Diffusion; Lithium glass; Rutherford backscattering spectrometry; X-ray photoelectron spectroscopy;
Crystalline phase dependent electrical properties of Mg incorporated tetragonal phase stabilized ZrO2 high-κ dielectric layer in Si based MOS capacitors
Keywords: اسپکترومتری بکار بردن رادرفورد; Tetragonal phase stabilized ZrO2; High-κ based MOS capacitors; Electron beam evaporation; Rutherford backscattering spectrometry; Atomic force microscopy;
Optimization of nanocomposite Au/TiO2 thin films towards LSPR optical-sensing
Keywords: اسپکترومتری بکار بردن رادرفورد; at.%; atomic percentage; EM; Electromagnetic; LSPR; Localized Surface Plasmon Resonance; NPs; Nanoparticles; RBS; Rutherford Backscattering spectrometry; RD; Reference Deposition; RI; Refractive Index; SEM; Scanning Electron Microscopy; SPR; Surface Plasm
Studies on interface between In2O3 and CuInTe2 thin films
Keywords: اسپکترومتری بکار بردن رادرفورد; CuInTe2; In2O3; Thin film interface; Rutherford backscattering spectrometry; Raman spectroscopy;
High-throughput ion beam analysis at imec
Keywords: اسپکترومتری بکار بردن رادرفورد; Ion beam analysis; Nano-electronics; Rutherford backscattering spectrometry;
Ion Beam Facilities at the National Centre for Accelerator based Research using a 3 MV Pelletron Accelerator
Keywords: اسپکترومتری بکار بردن رادرفورد; Accelerator; Ion beam analysis; ion implantation; material modifications; Rutherford Backscattering Spectrometry; Particle Induced X-ray Emission;
Synthesis of a GaN nanolayer on (001) GaAs by N ion implantation
Keywords: اسپکترومتری بکار بردن رادرفورد; Gallium nitride; Ion beam synthesis; Nitrogen; Ion implantation; Transmission Electron Microscopy; Rutherford Backscattering Spectrometry;
Elemental composition of membrane foulant layers using EDS, XPS, and RBS
Keywords: اسپکترومتری بکار بردن رادرفورد; Nanofiltration; Reverse osmosis; Fouling; Rutherford backscattering spectrometry; RBS; X-ray photoelectron spectroscopy; XPS; Energy-dispersive X-ray spectroscopy; EDS;
Investigation of phosphorous in thin films using the 31P(α,p)34S nuclear reaction
Keywords: اسپکترومتری بکار بردن رادرفورد; Nuclear reaction analysis; Phosphorus quantification; Phosphorus implantation; Sputtering deposition; Rutherford Backscattering Spectrometry
Thermally induced formation of metastable nanocomposites in amorphous Cr-Zr-O thin films deposited using reactive ion beam sputtering
Keywords: اسپکترومتری بکار بردن رادرفورد; Metastable oxides; In situ synchrotron diffraction; Crystallization; Reactive ion beam sputtering; Rutherford backscattering spectrometry
3D Auger quantitative depth profiling of individual nanoscaled III-V heterostructures
Keywords: اسپکترومتری بکار بردن رادرفورد; 81.05.Ea; 81.07.St; 68.65.Fg; 68.37.Xy; MOSFETs; metal oxide semiconductor field effect transistors; QWFETs; quantum well field effect transistors; QW; quantum well; RSFs; relative sensitivity factors; AES; Auger electron spectroscopy; SIMS; secondary ion
50Â years of ion channeling in materials science
Keywords: اسپکترومتری بکار بردن رادرفورد; Ion channeling; Material science; Crystallography; Defects and impurities; Rutherford backscattering spectrometry;
Reverse osmosis membrane composition, structure and performance modification by bisulphite, iron(III), bromide and chlorite exposure
Keywords: اسپکترومتری بکار بردن رادرفورد; Reverse osmosis; Degradation; Bisulphite; Iron; Bromide; Rutherford backscattering spectrometry;
Use of ion-assisted techniques for determining the structure of TiO2 nanotubes
Keywords: اسپکترومتری بکار بردن رادرفورد; Titanium dioxide nanotube; Electrochemical anodization; Rutherford backscattering spectrometry;
Influence of substrate temperature and annealing on structural and optical properties of TiO2 films deposited by reactive e-beam evaporation
Keywords: اسپکترومتری بکار بردن رادرفورد; TiO2 thin films; Reactive evaporation; Optical properties; Rutherford backscattering spectrometry; X-ray photoemission spectroscopy;
Optical properties of Ag nanoclusters formed by irradiation and annealing of SiO2/SiO2:Ag thin films
Keywords: اسپکترومتری بکار بردن رادرفورد; Electron beam deposition; Rutherford backscattering spectrometry; Nanocluster formation;
Channelling study of La1âxSrxCoO3 films on different substrates
Keywords: اسپکترومتری بکار بردن رادرفورد; La1âxSrxCoO3 film; Epitaxia; Strain; Rutherford backscattering spectrometry; Channeling;
Sputtering and surface structure modification of gold thin films deposited onto silicon substrates under the impact of 20–160 keV Ar+ ions
Keywords: اسپکترومتری بکار بردن رادرفورد; Sputtering yields; Rutherford backscattering spectrometry; Scanning electron microscopy; X-ray diffraction spectroscopy
Defects mediated diffusion in Pt/Co/Pt multilayers induced by dense electronic excitations
Keywords: اسپکترومتری بکار بردن رادرفورد; Interfaces; Diffusion; Rutherford backscattering spectrometry;
Pore-filling of Spiro-OMeTAD determined by Rutherford backscattering spectrometry in templated TiO2 photoelectrodes
Keywords: اسپکترومتری بکار بردن رادرفورد; Dye-sensitized solar cells; Pore filling; Rutherford backscattering spectrometry; Spiro-OMeTAD; Templated mesoporous films; TiO2
Defect structure of epitaxial CrxV1 â x thin films on MgO(001)
Keywords: اسپکترومتری بکار بردن رادرفورد; Epitaxy; CrxV1 â x; Alloys; Misfit dislocations; Rutherford backscattering spectrometry; Channeling; X-ray diffraction; Transmission electron microscopy;
Characterization and testing of Pt/TiO2/SiC thin film layered structure for gas sensing
Keywords: اسپکترومتری بکار بردن رادرفورد; Interface; Rutherford backscattering spectrometry; X-ray photoelectron spectroscopy; Gas sensor; Silicon carbide; Titanium dioxide; Sputtering;
Nitrogen implantation into diamond-like carbon films prepared by bipolar-type plasma based ion implantation
Keywords: اسپکترومتری بکار بردن رادرفورد; Diamond-like carbon (DLC); N ion implantation; Rutherford backscattering spectrometry; Elastic recoil detection analysis; Atomic force microscopy; Raman spectra
High precision determination of the InN content of Al1âxInxN thin films by Rutherford backscattering spectrometry
Keywords: اسپکترومتری بکار بردن رادرفورد; Rutherford backscattering spectrometry; AlInN; Composition analysis;
Growth of single-phase Mg0.3Zn0.7O films suitable for solar-blind optical devices on RS-MgO substrates
Keywords: اسپکترومتری بکار بردن رادرفورد; Magnesium zinc oxide; Molecular beam epitaxy; Magnesium oxide; Solar-blind; Rutherford backscattering spectrometry; X-ray diffraction