Investigation of thermal vibration correlation of [1Â 1Â 0] silicon lattice atoms by ion scattering
Keywords: اسپکترومتری بکار بردن رادرفورد; 34.50.Dy; 82.80.Yc; 82.80.Pv; 68.35.Ja; Ion-surface collision; Rutherford backscattering spectrometry; Ion induced Auger electron spectroscopy; Correlated thermal vibration;