Investigation of the recovery and recrystallization processes of Ni50.9Ti49.1 shape memory wires using in situ electrical resistance measurement

► The annealing process of NiTi wires was studied using DSC analysis and in situ electrical resistance measurement. ► The effect of different cold drawn values on recovery and recrystallization processes was investigated. ► Annealing of highly cold drawn sample at 450 °C results in formation of nano-subgrains in structure. ► Regarding to DSC analysis, recrystallization starts at above 560 °C for different cold drawn samples. ► Subgrains coarsening occur in highly cold drawn samples during annealing at 550 °C.