کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
1589273 1001984 2010 6 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
High contrast hollow-cone dark field transmission electron microscopy for nanocrystalline grain size quantification
موضوعات مرتبط
مهندسی و علوم پایه مهندسی مواد دانش مواد (عمومی)
پیش نمایش صفحه اول مقاله
High contrast hollow-cone dark field transmission electron microscopy for nanocrystalline grain size quantification
چکیده انگلیسی

In this paper, we describe hollow-cone dark field (HCDF) transmission electron microscopy (TEM) imaging, with a slightly convergent beam, as an improved technique that is suitable to form high contrast micrographs for nanocrystalline grain size quantification. We also examine the various factors that influence the HCDF TEM image quality, including the conditions of microscopy (alignment, focus and objective aperture size), the properties of the materials imaged (e.g., atomic number, strain, defects), and the characteristics of the TEM sample itself (e.g., thickness, ion milling artifacts). Sample preparation was found to be critical and an initial thinning by wet etching of the substrate (for thin film samples) or tripod polishing (for bulk samples), followed by low-angle ion milling was found to be the preferred approach for preparing high-quality electron transparent samples for HCDF imaging.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Micron - Volume 41, Issue 3, April 2010, Pages 177–182
نویسندگان
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