کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
1589451 1001992 2012 6 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
First principles pseudopotential calculation of electron energy loss near edge structures of lattice imperfections
موضوعات مرتبط
مهندسی و علوم پایه مهندسی مواد دانش مواد (عمومی)
پیش نمایش صفحه اول مقاله
First principles pseudopotential calculation of electron energy loss near edge structures of lattice imperfections
چکیده انگلیسی

Theoretical calculations of electron energy loss near edge structures (ELNES) of lattice imperfections, particularly a Ni(1 1 1)/ZrO2(1 1 1) heterointerface and an Al2O3 stacking fault on the {1 1¯ 0 0} plane, are performed using a first principles pseudopotential method. The present calculation can qualitatively reproduce spectral features as well as chemical shifts in experiment by employing a special pseudopotential designed for the excited atom with a core–hole. From the calculation, spectral changes observed in O-K ELNES from a Ni/ZrO2 interface can be attributable to interfacial oxygen–Ni interactions. In the O-K ELNES of Al2O3 stacking faults, theoretical calculation suggests that the spectral feature reflects coordination environment and chemical bonding. Powerful combinations of ELNES with a pseudopotential method used to investigate the atomic and electronic structures of lattice imperfections are demonstrated.


► We demonstrate a powerful combination of ELNES with first principles pseudopotential calculation to unravel atomic and electronic structure of lattice imperfection.
► By using pseudopotential ELNES calculation method, experimental ELNES from the lattice imperfection can be calculated.
► We pave the way to investigate atomic and electronic structure at lattice imperfection by combining ELNES and first principles pseudopotential calculation.
► We demonstrate that spectral features of ELNES can be sensitively changed by local coordinations and chemical bondings at the lattice imperfections.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Micron - Volume 43, Issue 1, January 2012, Pages 37–42
نویسندگان
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