کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
1589622 1002003 2010 7 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Soft X-ray imaging of thick carbon-based materials using the normal incidence multilayer optics
موضوعات مرتبط
مهندسی و علوم پایه مهندسی مواد دانش مواد (عمومی)
پیش نمایش صفحه اول مقاله
Soft X-ray imaging of thick carbon-based materials using the normal incidence multilayer optics
چکیده انگلیسی

The high transparency of carbon-containing materials in the spectral region of “carbon window” (λ ∼ 4.5–5 nm) introduces new opportunities for various soft X-ray microscopy applications. The development of efficient multilayer coated X-ray optics operating at the wavelengths of about 4.5 nm has stimulated a series of our imaging experiments to study thick biological and synthetic objects. Our experimental set-up consisted of a laser plasma X-ray source generated with the 2nd harmonics of Nd–glass laser, scandium-based thin-film filters, Co/C multilayer mirror and X-ray film UF-4. All soft X-ray images were produced with a single nanosecond exposure and demonstrated appropriate absorption contrast and detector-limited spatial resolution. A special attention was paid to the 3D imaging of thick low-density foam materials to be used in design of laser fusion targets.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Micron - Volume 41, Issue 7, October 2010, Pages 722–728
نویسندگان
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