کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
1589885 | 1002012 | 2007 | 7 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Imaging of carbon nanotubes with tin-palladium particles using STEM detector in a FE-SEM
دانلود مقاله + سفارش ترجمه
دانلود مقاله ISI انگلیسی
رایگان برای ایرانیان
کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
مهندسی مواد
دانش مواد (عمومی)
پیش نمایش صفحه اول مقاله
چکیده انگلیسی
Upgraded FE-SEM with STEM detector permits the observation and imaging of thin materials such as carbon nanotubes by transmitted electrons directly in a FE-SEM. It is important to know the resolution of transmitted electrons mode compared to the classical secondary electrons mode. The resolution was measured with SMART macro. This routine permits to quickly determine resolution of a micrograph, based on fast Fourier transform analysis. An optimum working distance value was found around 6Â mm for an accelerating voltage equal to 10Â keV. In addition to this, it was shown that the resolution obtained in bright field and secondary electron images at 15Â keV had appreciatively the same resolution. Also, it was shown that images in dark field mode have a poorer resolution compared with bright field transmitted electrons and secondary electrons images.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Micron - Volume 38, Issue 4, June 2007, Pages 402-408
Journal: Micron - Volume 38, Issue 4, June 2007, Pages 402-408
نویسندگان
C. Probst, R. Gauvin, R.A.L. Drew,