Structural and Dielectric Study of Zirconium Modified Bismuth Sodium Titanate Thin Film

Substitution of both isovalent and aliovalent cations for the host ones in perovskite lattice plays a very important role in these modification mechanism. The polycrystalline (Bi0.5Na0.5)Zr0.08Ti0.92O3 (BNZT) ferroelectric thin films were deposited by using CBD method. XRD analysis revealed a rhombohedral perovskite type structure with lattice constants a=b=c=3.790 Å and α=89.65°. The morphological and dielectric studies have been also made.