Structural, Optical and Magnetic Properties of MnZnO Thin Films

Manganese zinc oxide thin films are deposited on glass substrate by sol gel dip coating method at withdrawal speed of 250 mm/s. Characterization techniques of X-Ray diffraction (XRD), Ellipsometry, Vibrating Sample Magnetometer (VSM) and Scanning Electron Microscope (SEM) are used to study the structural, optical and magnetic properties of the films. X-ray diffraction pattern reveals that films were crystalline and have hexagonal wurtzite structure. Optical study shows that MnZnO films have band gap of 3.74 eV. MnZnO thin films show ferromagnetic behavior at room temperature.