Cu/ nano-CuO Thick Film/Cu Double Barrier Junction: Structural and Dielectric Study

In this paper, the structural and dielectric properties of CuO nanoparticles have been investigated by extended X-ray powder diffraction and impedance spectroscopy, respectively. The X-ray diffraction reveals the monoclinic phase structure of nanoparticles with preferential orientations parallel to (002) and (111) crystalline planes. The average crystallite size was calculated to be 18.3 nm from the given line widths using Scherrer's equation. Impedance spectroscopy was performed on Cu/ nano- CuO thick film/Cu double barrier junction as a function of frequency in the range 1 Hz - 106 Hz, at room temperature. The complex impedance plots demonstrate that the dielectric characterizations are strongly frequency dependent.