کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
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1645497 | 1517289 | 2013 | 4 صفحه PDF | دانلود رایگان |
We report the successful use of focussed ion beam (FIB) milling of trenches in a material of complex microstructure in order to visualize a selected area (32×32 μm) for further multi-analysis with submicron resolution. This capability is demonstrated for a Zn–5 wt% Al coating Galfan™ on steel. The very same eutectic surface area was analyzed by three complementary and independent techniques providing consistent information on the lateral distribution of morphology and elemental composition (scanning electron microscopy with x-ray microanalysis, SEM/EDS), topography and Volta potential (scanning Kelvin probe force microscopy, SKPFM) and oxide composition (confocal Raman microspectroscopy, CRM). The approach enables a straightforward way to explore the interplay between microstructure and local corrosion of metallic materials.
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► FIB is used to visualize a selected area for independent analytical techniques.
► Analysis using three techniques with submicron resolution at the very same area.
► The interplay between microstructure and local corrosion can be explored.
Journal: Materials Letters - Volume 98, 1 May 2013, Pages 230–233