کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
1646386 1517299 2012 4 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Structural evolution of Ge2Sb2Te5 films under the 488 nm laser irradiation
موضوعات مرتبط
مهندسی و علوم پایه مهندسی مواد فناوری نانو (نانو تکنولوژی)
پیش نمایش صفحه اول مقاله
Structural evolution of Ge2Sb2Te5 films under the 488 nm laser irradiation
چکیده انگلیسی

Ge2Sb2Te5 films were locally crystallized by a tightly focused laser beam and the structural evolution was studied by Raman scatting. The marks recorded by a broad range of laser power were studied by optical microscope. Raman spectra of films with irradiation power of 0.1 mW and 1 mW were consistent with those of films annealed at 140 °C and 400 °C, respectively. It reveals that both the cubic and hexagonal crystalline phases have been achieved under the irradiation of 488 nm laser in amorphous Ge2Sb2Te5 films. Specifically, the appearance of a new band of ∼141 cm−1 in films with irradiation power larger than 1.25 mW confirms that the over-irradiation causes the segregation of Te crystalline phase in films.


► Ge2Sb2Te5 films were locally crystallized by a tightly focused laser beam and the structural evolution was studied by Raman scatting.
► Both the cubic and hexagonal crystalline phases have been achieved under the irradiation of 488 nm laser and the two crystalline phases have been distinguished by Raman spectra comparison.
► Specifically, we also confirm that the over-irradiation causes the segregation of Te crystalline phase in films.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Materials Letters - Volume 88, 1 December 2012, Pages 148–151
نویسندگان
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