کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
1646712 1517301 2012 4 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Morphologies and grain orientations of Cu–Sn intermetallic compounds in Sn3.0Ag0.5Cu/Cu solder joints
موضوعات مرتبط
مهندسی و علوم پایه مهندسی مواد فناوری نانو (نانو تکنولوژی)
پیش نمایش صفحه اول مقاله
Morphologies and grain orientations of Cu–Sn intermetallic compounds in Sn3.0Ag0.5Cu/Cu solder joints
چکیده انگلیسی

Morphologies and grain orientations of Cu6Sn5 and Cu3Sn intermetallic compounds (IMCs) at the interface of Sn3.5Ag0.5Cu lead-free solder alloy and copper substrates were investigated by Electron Backscatter Diffraction (EBSD) technology combined with Scanning Electron Microscopy (SEM). Scalloped Cu6Sn5, Cu6Sn5 planes and six-prism shaped Cu6Sn5 IMCs were observed at the interface after 48 h of soldering at 250 °C. Moreover, Cu6Sn5 planes emerged in pairs on top and beside the scalloped Cu6Sn5, and two adjacent Cu6Sn5 planes were with an angle of 120°. Cu3Sn and scalloped Cu6Sn5 IMCs had preferred orientations, and they were Cu6Sn5 (0001)∥substrate surface, and Cu3Sn (1¯00) and (100)∥substrate surface.


► Grain orientations of Cu–Sn IMCs with long time soldering were investigated.
► Preferred orientation of Cu6Sn5 was Cu6Sn5 (0001)∥substrate surface.
► Preferred orientations of Cu3Sn were Cu3Sn (11¯00) and (100)∥substrate surface.
► Cu6Sn5 planes emerged in pairs on top and beside the scalloped Cu6Sn5.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Materials Letters - Volume 86, 1 November 2012, Pages 157–160
نویسندگان
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