Dielectric strength and reliability of ferroelectric PLZT films deposited on nickel substrates

We have deposited ferroelectric (FE) Pb0.92La0.08Zr0.52Ti0.48O3 (PLZT) films on nickel substrates by chemical solution deposition. Energy density of ≈ 46 J/cm3 has been measured with 1.15-µm-thick PLZT/LNO/Ni film-on-foil capacitors. A series of highly accelerated lifetime tests were performed to determine the reliability of these FE film-on-foil capacitors under high temperature and high field stress. Samples were exposed to temperatures ranging from 100 to 150 °C and electric fields ranging from 8.7 × 105 V/cm to 1.3 × 106 V/cm. The breakdown behavior of the FE PLZT film-on-foil capacitors was evaluated by Weibull analysis. The activation energy was determined to be ≈ 0.35 eV when an electric field of 1.05 × 106 V/cm was applied. The voltage acceleration factor was ≈ − 6.3 at 100 °C. The mean time to failure was projected to be > 3000 h at 100 °C with a dc electric field of ≈ 2.6 × 105 V/cm.