کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
1657443 | 1008287 | 2014 | 19 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Structurally tailored Cu(InxGa1 â x) Se2 thin films via RF magnetron sputtering
دانلود مقاله + سفارش ترجمه
دانلود مقاله ISI انگلیسی
رایگان برای ایرانیان
کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
مهندسی مواد
فناوری نانو (نانو تکنولوژی)
پیش نمایش صفحه اول مقاله
چکیده انگلیسی
Cu(InxGa1 â x) Se2 (CIGS) thin films were deposited onto soda-lime glass substrates with Mo coating via the one step radio frequency (RF) magnetron sputtering without a post-selenization process at the substrate temperature varying from 550 °C to 630 °C. The effect of deposition temperature on the structural properties of CIGS thin films has been characterized by X-ray diffraction (XRD), Raman spectroscopy, field emission scanning electron microscopy (FESEM), and energy dispersive X-ray spectroscopy (EDX). It was found that an increased deposition temperature of up to 580 °C contributes to produce the smooth surface, large grain size, and increased crystallinity of the thin films. But further increased deposition temperature results in a decrease in smoothness and an increase in grain size. The optimized temperature (580 °C) shows the best effect on the composition and formation of the chalcopyrite structure without impurities.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Surface and Coatings Technology - Volume 259, Part A, 25 November 2014, Pages 94-97
Journal: Surface and Coatings Technology - Volume 259, Part A, 25 November 2014, Pages 94-97
نویسندگان
Tao Jia, Lei Dong, Zhiguo Zhao, Xifei Li, Dejun Li,