RETRACTED: Microstructural study of composite C–Cu films deposited by dc magnetron sputtering

This article has been retracted at the request of the Editor-in-Chief. Please see Elsevier Policy on Article Withdrawal (http://www.elsevier.com/locate/withdrawalpolicy).Reason: This article duplicates significant parts of a paper that had already appeared in Thin Solid Films 515 (2007) 6672–6675, doi:10.1016/j.tsf.2007.01.007. One of the conditions of submission of a paper for publication is that authors declare explicitly that the paper is not under consideration for publication elsewhere. Re-use of any data should be appropriately cited. As such this article represents a severe abuse of the scientific publishing system. The scientific community takes a very strong view on this matter and we apologize to readers of the journal that this was not detected during the submission process.