کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
1662782 | 1517705 | 2006 | 8 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Multi-wavelength Raman investigation of sputtered a-C film nanostructure
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
مهندسی مواد
فناوری نانو (نانو تکنولوژی)
پیش نمایش صفحه اول مقاله
![عکس صفحه اول مقاله: Multi-wavelength Raman investigation of sputtered a-C film nanostructure Multi-wavelength Raman investigation of sputtered a-C film nanostructure](/preview/png/1662782.png)
چکیده انگلیسی
Multi-wavelength Raman spectroscopy is employed to investigate the nanostructure of amorphous carbon (a-C) films, prepared by sputtering at 20 and 400 °C, and the structural modifications produced by thermal anneling at 400 and 800 °C. The results are discussed in the light of more recent assessments on resonant Raman spectroscopy in C-based materials. High-temperature depositions and thermal annealing promote development and/or clustering of sp2 phase, with film optical transparency reduction. In both the cases, nanoclusters of larger and more uniform dimensions are formed at higher temperatures. However, annealing process favours aromaticity, while high-temperature depositions oppositely augments distortions and promotes bond disorder.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Surface and Coatings Technology - Volume 200, Issues 18â19, 8 May 2006, Pages 5427-5434
Journal: Surface and Coatings Technology - Volume 200, Issues 18â19, 8 May 2006, Pages 5427-5434
نویسندگان
G. Messina, S. Santangelo,