Aberration corrected Lorentz scanning transmission electron microscopy

• Demonstration of nanometre scale resolution in magnetic field free environment using aberration correction in the scanning transmission electron microscope (STEM).
• Implementation of differential phase contrast mode of Lorentz microscopy in aberration corrected STEM with improved sensitivity.
• Quantitative imaging of magnetic induction of nanostructures in amorphous and cross-section samples.

We present results from an aberration corrected scanning transmission electron microscope which has been customised for high resolution quantitative Lorentz microscopy with the sample located in a magnetic field free or low field environment. We discuss the innovations in microscope instrumentation and additional hardware that underpin the imaging improvements in resolution and detection with a focus on developments in differential phase contrast microscopy. Examples from materials possessing nanometre scale variations in magnetisation illustrate the potential for aberration corrected Lorentz imaging as a tool to further our understanding of magnetism on this lengthscale.