کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
1677508 | 1518359 | 2012 | 15 صفحه PDF | دانلود رایگان |
Several electron microscopy techniques available for characterising thin-film solar cells are described, including recent advances in instrumentation, such as aberration-correction, monochromators, time-resolved cathodoluminescence and focused ion-beam microscopy. Two generic problems in thin-film solar cell characterisation, namely electrical activity of grain boundaries and 3D morphology of excitionic solar cells, are also discussed from the standpoint of electron microscopy. The opportunities as well as challenges facing application of these techniques to thin-film and excitonic solar cells are highlighted.
► Electron microscopy characterisation of thin-film solar cells is reviewed.
► Measurement of electrical and optical properties, morphology, etc. are discussed.
► Opportunities and challenges facing solar cell characterisation are highlighted.
Journal: Ultramicroscopy - Volume 119, August 2012, Pages 82–96