کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
1677559 | 1518360 | 2012 | 10 صفحه PDF | دانلود رایگان |
![عکس صفحه اول مقاله: Correcting scanning instabilities from images of periodic structures Correcting scanning instabilities from images of periodic structures](/preview/png/1677559.png)
A method for measuring and correcting the row displacement errors in lattice images acquired using scanning based methods is presented. This type of distortion is apparent in lattice-resolved images acquired using scanning-based techniques such as scanning transmission electron microscopy (STEM) and translates to vertical streaks convolving every feature in Fourier space. This paper presents a method to measure and correct the distortion based on the phase analysis of the streaks in Fourier space. The validity and the precision of the method is demonstrated using a model image and two experimental STEM images of Si 〈110〉 thin film and a 5 nm CoPt disordered nanocrystal. The algorithm is implemented in a freely available Digital Micrograph™ script.
► Method to remove scanning instabilities in micrographs exhibiting periodic features.
► Technique highly precise and accurate as demonstrated using test image.
► Experimental micrographs of Si thin film and CoPt nanocrystal successfully restored.
► Method is artefact-free and improves the overall quality of the micrograph.
Journal: Ultramicroscopy - Volume 118, July 2012, Pages 67–76