Analysis of time-resolved interaction force mode AFM imaging using active and passive probes

► Model developed to simulate TRIF imaging in AFM for both passive and active probes. ► Topography errors occur due to elasticity and adhesion variations with RMS control. ► Peak force control eliminates adhesion based errors, but elasticity errors remain. ► Minimal repulsive force is required to eliminate elasticity based errors. ► Active tip control minimizes errors, preserves stability and material information.