کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
1677696 1518363 2012 9 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Discrete tomography of demanding samples based on a modified SIRT algorithm
موضوعات مرتبط
مهندسی و علوم پایه مهندسی مواد فناوری نانو (نانو تکنولوژی)
پیش نمایش صفحه اول مقاله
Discrete tomography of demanding samples based on a modified SIRT algorithm
چکیده انگلیسی

The 3D structure of three particularly challenging samples was reconstructed by electron tomography. Due to sample limitations resulting in a large missing wedge and large tilt increments respectively the 3D structure could not be reconstructed by standard iterative algorithms; even a recently developed discrete algorithm failed until the input parameters for discrete reconstruction were improved. These challenges were addressed by adding a mask in each step of the preceding standard iterative reconstruction, setting all voxels known to be vacuum as zero, thus improving the segmentation and the 3D starting model. The position of these vacuum voxels is obtained from TEM images or other measurement data.


► Input parameters for discrete tomography are usually obtained from preceding conventional algorithms.
► In each conventional iteration step we add a mask setting known vacuum voxels to zero.
► This improves segmentation parameters and the starting model for discrete tomography.
► We demonstrate the method for a series of only 9 exposures and two series with a tilt range of only ±40°.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Ultramicroscopy - Volume 115, April 2012, Pages 41–49
نویسندگان
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