کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
1677726 | 1518352 | 2013 | 4 صفحه PDF | دانلود رایگان |

X-ray ptychography is a rapidly developing phase retrieval technique that combines the experimental advantages of coherent diffractive imaging with the possibility to image extended specimens. Data collection requires imaging at several scan points with high positional accuracy, which implies susceptibility to mechanical drift. This is a well-known problem in ptychographic scans, which can reduce reconstruction quality and limit the achievable resolution. Using a simple model for positional drift, we show that a set of corrected positions can be found systematically, leading to strong improvements in the reconstruction of a Siemens star dataset severely affected by drift.
► Mechanical drift during ptychographic scans can be corrected afterwards.
► The reconstruction quality is significantly improved after the drift correction.
► Different drift models can be used with this approach.
Journal: Ultramicroscopy - Volume 126, March 2013, Pages 44–47