کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
1677743 1518367 2010 10 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Study of structures at the boundary and defects in organic thin films of perchlorocoronene by high-resolution and analytical transmission electron microscopy
موضوعات مرتبط
مهندسی و علوم پایه مهندسی مواد فناوری نانو (نانو تکنولوژی)
پیش نمایش صفحه اول مقاله
Study of structures at the boundary and defects in organic thin films of perchlorocoronene by high-resolution and analytical transmission electron microscopy
چکیده انگلیسی
Both the periodic and non-periodic structures of perchlorocoronene (C24Cl12) crystals were characterized by high-resolution transmission electron microscopy (HRTEM), electron diffraction (ED), electron energy-loss spectroscopy (EELS), and energy-filtered transmission electron microscopy (EFTEM). The HRTEM images at the boundary of the C24Cl12 crystals exhibit the flexibility of defect structures, where molecules align to compensate for the discontinuity between two different domains. Emphasized by the filtered images, it was found that the non-periodic regions are created everywhere with a small electron beam irradiation (∼106 electrons nm−2) and then spread over the entire regions to completely destroy the periodic structures after a higher electron dose (∼2×106 electrons nm−2). The effect of the electron beam irradiation was monitored by ED, EELS, and EFTEM, where periodic structures and content elements are well preserved up to 106 electrons nm−2, but chlorine atoms decreased with a much higher electron dose. This is explained by the breakage of the C-Cl bond to detach chlorine atoms, confirmed by energy-loss near the edge structures (ELNES) of carbon π⁎ peaks and chlorine loss at the edge of the specimen, as well as by theoretical simulation. The detachment of chlorine is localized at the peripheral edge around a hole confirmed by core-loss EFTEM imaging.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Ultramicroscopy - Volume 110, Issue 12, November 2010, Pages 1465-1474
نویسندگان
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