کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
1677804 1009910 2010 6 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Coaxial arrangement of a scanning probe and an X-ray microscope as a novel tool for nanoscience
موضوعات مرتبط
مهندسی و علوم پایه مهندسی مواد فناوری نانو (نانو تکنولوژی)
پیش نمایش صفحه اول مقاله
Coaxial arrangement of a scanning probe and an X-ray microscope as a novel tool for nanoscience
چکیده انگلیسی

We report on the design and first tests of a novel instrument aimed at combining the benefits of scanning force microscopy with those of X-ray spectroscopy. For this we built an instrument combining a scanning transmission X-ray microscope with a beam-deflection atomic force microscope in a coaxial geometry. This allows to combine X-ray absorption spectroscopy and high resolution topography in-situ. When replacing the conventional scanning probe tip by a coaxially shielded tip the instrument will allow detection of the photoelectrons produced by resonant X-ray absorption. This could yield spectroscopic information with a spatial resolution approaching the values achievable with atomic force microscopy.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Ultramicroscopy - Volume 110, Issue 10, September 2010, Pages 1267–1272
نویسندگان
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