کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
1677814 1009910 2010 6 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Simulation of a hollow cone-shaped probe in aberration-corrected STEM for high-resolution tomography
موضوعات مرتبط
مهندسی و علوم پایه مهندسی مواد فناوری نانو (نانو تکنولوژی)
پیش نمایش صفحه اول مقاله
Simulation of a hollow cone-shaped probe in aberration-corrected STEM for high-resolution tomography
چکیده انگلیسی

In a simulation study, we found that focal depth extension using a hollow cone-shaped probe with an annular aperture is useful for three-dimension (3D) tomography of aberration-corrected scanning transmission electron microscopy (STEM). Our calculations showed that, for 200 kV STEM, a sub-angstrom sized probe could extend the focal depth from a few to more than several tens nm. We also examined the influence of obstructing bridges, including actual fabricated annular apertures, on focused probe intensity distribution. We found that, to avoid any distortion of probe intensity, the width of the bridges should be narrow. Quantitative evaluation showed that the ratio of obstructing area of the bridges to the area of the annular slit should be less than 0.11.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Ultramicroscopy - Volume 110, Issue 10, September 2010, Pages 1332–1337
نویسندگان
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