Combining real and reciprocal space information for aberration free coherent electron diffractive imaging

Information from imaging and diffraction planes, or real and reciprocal spaces, of transmission electron microscopes (TEM) can be combined using iterative transformation algorithms to reconstruct the complex wave function, to improve image resolution and to remove residual aberrations in the case of aberration corrected TEM. Here, we describe the experimental and computation techniques needed for combining real and reciprocal space information. We demonstrate these techniques by reconstructing the complex wave function of quantum dots and carbon nanotubes beyond the microscope's resolution limit.

Research Highlights
► An aberration free imaging method is described here for high resolution electron imaging.
► The method uses diffraction information to improve the resolution and to remove residual aberrations in electron images.
► The phase problem is solved using iterative phase retrieval and oversampling.
► Examples are shown for imaging quantum dots and carbon nanotubes.