کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
1677992 1009924 2011 6 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Quantitative atom probe analyses of rare-earth-doped ceria by femtosecond pulsed laser
موضوعات مرتبط
مهندسی و علوم پایه مهندسی مواد فناوری نانو (نانو تکنولوژی)
پیش نمایش صفحه اول مقاله
Quantitative atom probe analyses of rare-earth-doped ceria by femtosecond pulsed laser
چکیده انگلیسی

We have investigated the irradiation conditions of femtosecond laser pulses for quantitative atom probe analyses of rare-earth (RE) doped ceria. The influence of laser wavelength, power, pulse frequency, as well as specimen temperature on mass resolution and background noise of atom probe mass spectra were investigated. Furthermore, quantitative atom probe analysis of yttrium distribution in Y-doped ceria was carried out with the optimized evaporation conditions. The distribution of yttrium was found to be uniform within the grains, but they were confirmed to be segregated at grain boundaries.

Research highlights
► Laser atom probe tomography of rare-earth doped ceria.
► The influence of laser wavelength, power, pulse frequency and specimen temperature were investigated.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Ultramicroscopy - Volume 111, Issue 6, May 2011, Pages 589–594
نویسندگان
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