کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
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1678177 | 1009931 | 2009 | 5 صفحه PDF | دانلود رایگان |
![عکس صفحه اول مقاله: On-tip sub-micrometer Hall probes for magnetic microscopy prepared by AFM lithography On-tip sub-micrometer Hall probes for magnetic microscopy prepared by AFM lithography](/preview/png/1678177.png)
We developed a technology of sub-micrometer Hall probes for future application in scanning hall probe microscopy (SHPM) and magnetic force microscopy (MFM). First, the Hall probes of ∼9-μm dimensions are prepared on the top of high-aspect-ratio GaAs pyramids with an InGaP/AlGaAs/GaAs active layer using wet-chemical etching and non-planar lithography. Then we show that the active area of planar Hall probes can be downsized to sub-micrometer dimensions by local anodic oxidation technique using an atomic force microscope. Such planar probes are tested and their noise and magnetic field sensitivity are evaluated. Finally, the two technologies are combined to fabricate sub-micrometer Hall probes on the top of high-aspect ratio mesa for future SHPM and MFM techniques.
Journal: Ultramicroscopy - Volume 109, Issue 8, July 2009, Pages 1080–1084