کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
1678224 1009935 2010 6 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Tomography of asymmetric bulk specimens imaged by scanning electron microscopy
موضوعات مرتبط
مهندسی و علوم پایه مهندسی مواد فناوری نانو (نانو تکنولوژی)
پیش نمایش صفحه اول مقاله
Tomography of asymmetric bulk specimens imaged by scanning electron microscopy
چکیده انگلیسی

The scanning electron microscope produces nanometer-resolution surface images of biological samples preserved in a life-like state. Extracting three-dimensional information from these two-dimensional images has been the subject of long and ongoing research. We present here a general method and theoretical basis for reconstructing the surfaces of SEM specimens imaged from multiple directions by back-projection. The resulting reconstructions are faithful representations of the original specimen geometry, even when the input images are blurred and have low signal-to-noise ratio.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Ultramicroscopy - Volume 110, Issue 2, January 2010, Pages 170–175
نویسندگان
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