کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
1678319 1009938 2010 12 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Contrast inversion in non-contact Dynamic Scanning Force Microscopy: What is high and what is low?
موضوعات مرتبط
مهندسی و علوم پایه مهندسی مواد فناوری نانو (نانو تکنولوژی)
پیش نمایش صفحه اول مقاله
Contrast inversion in non-contact Dynamic Scanning Force Microscopy: What is high and what is low?
چکیده انگلیسی

The present work proves that when non-contact Dynamic Scanning Force Microscopy (DSFM) is performed in ambient conditions wrong height measurements of heterogeneous samples can be obtained. In some extreme cases even contrast inversion can be observed. Alkanethiol islands on Au (1 1 1) have been used as model system, where contrast inversion is observed with different DSFM modes and various data acquisition parameters. To understand this effect, spectroscopy measurements have been used to show that contrast inversion is really a consequence of the differences in the interaction measured between tip and sample on the bare Au substrate and on the alkanethiol islands. We propose that this interaction is mainly induced by liquid necks forming between tip and sample, which is much stronger on the hydrophilic Au substrate than on the hydrophobic alkanethiol islands.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Ultramicroscopy - Volume 110, Issue 7, June 2010, Pages 789–800
نویسندگان
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