کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
1678471 1009942 2009 7 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Near-grain-boundary characterization by atomic force microscopy
موضوعات مرتبط
مهندسی و علوم پایه مهندسی مواد فناوری نانو (نانو تکنولوژی)
پیش نمایش صفحه اول مقاله
Near-grain-boundary characterization by atomic force microscopy
چکیده انگلیسی
Characterization of near-grain boundary is carried out by atomic force microscopy (AFM). It has been observed to be the most suitable technique owing to its capability to investigate the surface at high resolution. Commercial purity-grade nickel processed under different conditions, viz., (i) cold-rolled and annealed and (ii) thermally etched condition without cold rolling, is considered in the present study. AFM crystallographic data match well with the standard data. Hence, it establishes two grain-boundary relations viz., plane matching and coincidence site lattice (CSL Σ=9) relation for the two different sample conditions.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Ultramicroscopy - Volume 109, Issue 6, May 2009, Pages 741-747
نویسندگان
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