کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
1678608 1009949 2010 12 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Off-axis and inline electron holography: A quantitative comparison
موضوعات مرتبط
مهندسی و علوم پایه مهندسی مواد فناوری نانو (نانو تکنولوژی)
پیش نمایش صفحه اول مقاله
Off-axis and inline electron holography: A quantitative comparison
چکیده انگلیسی

Capable of quantitatively imaging static magnetic and electric potentials and even strain electron holography is a very versatile and powerful TEM technique. In this paper we compare off-axis electron holography with a recently developed focal series reconstruction algorithm and phase retrieval based on the transport of intensity equation. Based on theoretical considerations and simulations we compare the different techniques with respect to parameters such as the coherence requirements, field of view, resolution, noise properties, and other required experimental conditions.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Ultramicroscopy - Volume 110, Issue 5, April 2010, Pages 460–471
نویسندگان
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