Electron microscope object reconstruction: Retrieval of local variations in mixed type potentials. Part I: Theoretical preliminaries

The direct object retrieval via the linearized inversion of the dynamical scattering matrix is extended using a second order perturbation theory and including mixed type potentials. The higher order perturbation increases the confidence region extracting object thickness and bending directly out of amplitude and phase of an electron wave without using trial-and-error iterative matching. Applying parameterization of a mixed type total scattering potential as a priori information enables a simple extension of the structure retrieval procedure to reconstruct local variations of the object potential, too.