کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
1678620 1009949 2010 8 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Imaging of soft and hard materials using a Boersch phase plate in a transmission electron microscope
موضوعات مرتبط
مهندسی و علوم پایه مهندسی مواد فناوری نانو (نانو تکنولوژی)
پیش نمایش صفحه اول مقاله
Imaging of soft and hard materials using a Boersch phase plate in a transmission electron microscope
چکیده انگلیسی

Using two levels of electron beam lithography, vapor phase deposition techniques, and FIB etching, we have fabricated an electrostatic Boersch phase plate for contrast enhancement of weak phase objects in a transmission electron microscope. The phase plate has suitable dimensions for the imaging of small biological samples without compromising the high-resolution capabilities of the microscope. A micro-structured electrode allows for phase tuning of the unscattered electron beam, which enables the recording of contrast enhanced in-focus images and in-line holograms. We have demonstrated experimentally that our phase plate improves the contrast of carbon nanotubes while maintaining high-resolution imaging performance, which is demonstrated for the case of an AlGaAs heterostructure. The development opens a new way to study interfaces between soft and hard materials.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Ultramicroscopy - Volume 110, Issue 5, April 2010, Pages 563–570
نویسندگان
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