کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
1678681 1009954 2010 7 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
A method for correcting the effect of specimen drift on coherent diffractive imaging
موضوعات مرتبط
مهندسی و علوم پایه مهندسی مواد فناوری نانو (نانو تکنولوژی)
پیش نمایش صفحه اول مقاله
A method for correcting the effect of specimen drift on coherent diffractive imaging
چکیده انگلیسی

Coherent diffractive imaging involves the inversion of a diffraction pattern to find the wave function at the exit-surface plane of the specimen. It is a promising technique for imaging, for example, nanoparticles with electrons and biological molecules with X-rays. If the illumination is not a plane wave of infinite extent, then a relative drift between the illumination and the object introduces errors into the diffraction pattern; an issue which is often overlooked. This may be of particular importance for applications with electron microscopes which use nanoscale probes. Here we show that beams which are uniform over a sufficiently large region can be used to pose a phase retrieval problem that is immune from specimen drift, provided suitable analysis of the diffraction data is undertaken. The method only applies to objects contained within a support that is smaller than a uniform region of the beam.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Ultramicroscopy - Volume 110, Issue 4, March 2010, Pages 359–365
نویسندگان
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