کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
1678759 | 1009960 | 2009 | 5 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Probing non-dipole allowed excitations in highly correlated materials with nanoscale resolution
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موضوعات مرتبط
مهندسی و علوم پایه
مهندسی مواد
فناوری نانو (نانو تکنولوژی)
پیش نمایش صفحه اول مقاله
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چکیده انگلیسی
Here, we demonstrate that non-dipole allowed d–d excitations in NiO can be measured by electron energy loss spectroscopy (EELS) in transmission electron microscopes (TEM). Strong excitations from 3A2g ground states to 3T1g excited states are measured at 1.7 and 3 eV when transferred momentum are beyond 1.5 Å−1. We show that these d–d excitations can be collected with a nanometrical resolution in a dedicated scanning transmission electron microscope (STEM) by setting a good compromise between the convergence angle of the electron probe and the collected transferred momentum. This work opens new possibilities for the study of strongly correlated materials on a nanoscale.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Ultramicroscopy - Volume 109, Issue 11, October 2009, Pages 1333–1337
Journal: Ultramicroscopy - Volume 109, Issue 11, October 2009, Pages 1333–1337
نویسندگان
Alexandre Gloter, Ming-Wen Chu, Mathieu Kociak, Cheng Hsuan Chen, Christian Colliex,