کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
1678863 | 1009973 | 2009 | 5 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Electromechanical properties of individual single-walled carbon nanotubes grown on focused-ion-beam patterned substrates
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
مهندسی مواد
فناوری نانو (نانو تکنولوژی)
پیش نمایش صفحه اول مقاله
چکیده انگلیسی
The combined capabilities of focused-ion-beam (FIB) nano-patterning and transmission electron microscope characterization have been employed to measure the electromechanical resonance of individual single-walled carbon nanotubes (SWNTs). Suspended and isolated SWNTs of length up to 7 μm were grown on FIB-patterned molybdenum substrates. The Young's modulus of a 5 nm diameter SWNT is found to be E=1.34±0.06 TPa, which is deduced from the measured resonance frequency based on the elastic beam theory. The patterned substrates help locate the nanostructure effectively, allowing the same structure to be inspected after multiple processing steps.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Ultramicroscopy - Volume 109, Issue 2, January 2009, Pages 167–171
Journal: Ultramicroscopy - Volume 109, Issue 2, January 2009, Pages 167–171
نویسندگان
Papot Jaroenapibal, Yeonwoong Jung, Stephane Evoy, David E. Luzzi,