کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
1678866 1009973 2009 4 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Origin of phase shift in atomic force microscopic investigation of the surface morphology of NR/NBR blend film
موضوعات مرتبط
مهندسی و علوم پایه مهندسی مواد فناوری نانو (نانو تکنولوژی)
پیش نمایش صفحه اول مقاله
Origin of phase shift in atomic force microscopic investigation of the surface morphology of NR/NBR blend film
چکیده انگلیسی
Atomic force microscopy (AFM) was used to study the morphology and surface properties of NR/NBR blend. Blends at 1/3, 1/1 and 3/1 weight ratios were prepared in benzene and formed film by casting. AFM phase images of these blends in tapping mode displayed islands in the sea morphology or matrix-dispersed structures. For blend 1/3, NR formed dispersed phase while in blends 1/1 and 3/1 phase inversion was observed. NR showed higher phase shift angle in AFM phase imaging for all blends. This circumstance was governed by adhesion energy hysteresis between the device tip and the rubber surface rather than surface stiffness of the materials, as proved by force distance measurements in the AFM contact mode.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Ultramicroscopy - Volume 109, Issue 2, January 2009, Pages 189-192
نویسندگان
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