کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
1678904 1009975 2007 5 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Study of the influence of the dielectric layer thickness in a CNT-FED
موضوعات مرتبط
مهندسی و علوم پایه مهندسی مواد فناوری نانو (نانو تکنولوژی)
پیش نمایش صفحه اول مقاله
Study of the influence of the dielectric layer thickness in a CNT-FED
چکیده انگلیسی

An experimental investigation is carried out to study the influences of the dielectric layer thickness variation on the field emission characteristics and luminance distribution in a CNT-FED fabricated by screen-printing. Two steps are contained in the investigation: (1) the dielectric layer thickness fluctuations are presented with an ultrasonic thickness gauge, and (2) a simulation model is constructed to study the corresponding influences of the dielectric layer thickness fluctuations on the field emission characteristics and luminance uniformity on the screen. Our findings indicate that the dielectric layer thickness fluctuations are mainly larger than 5 μm, which mean the dielectric layer thickness fluctuation is an important cause of the non-uniform luminance distribution according to the analysis results from our simulation model. From the simulation results, we also determine the tolerance of the dielectric layer thickness in a CNT-FED to achieve uniform luminance and spot size on the screen.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Ultramicroscopy - Volume 107, Issue 9, September 2007, Pages 844–848
نویسندگان
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