کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
1678963 1009983 2008 10 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
An emission-potential multislice approximation to simulate thermal diffuse scattering in high-resolution transmission electron microscopy
کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه مهندسی مواد فناوری نانو (نانو تکنولوژی)
پیش نمایش صفحه اول مقاله
An emission-potential multislice approximation to simulate thermal diffuse scattering in high-resolution transmission electron microscopy
چکیده انگلیسی

Thermal diffuse scattered electrons significantly contribute to high-resolution transmission electron microscopy images. Their intensity adds to the background and is peaked at positions of atomic columns. In this paper we suggest an approximation to simulate intensity of thermal diffuse scattered electrons in plane-wave illumination transmission electron microscopy using an emission-potential multislice algorithm which is computationally less intensive than the frozen lattice approximation or the mutual intensity approach. Intensity patterns are computed for Au and InSb for different crystal orientations. These results are compared with intensities from the frozen lattice approximation based on uncorrelated vibration of atoms as well as with the frozen phonon approximation for Au. The frozen phonon method uses a detailed phonon model based on force constants we computed by a density functional theory approach. The comparison shows that our suggested emission-potential method is in close agreement with both the frozen lattice and the frozen phonon approximations.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Ultramicroscopy - Volume 108, Issue 12, November 2008, Pages 1504–1513
نویسندگان
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