کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
1679037 1518372 2006 11 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Modelling high-resolution electron microscopy based on core-loss spectroscopy
موضوعات مرتبط
مهندسی و علوم پایه مهندسی مواد فناوری نانو (نانو تکنولوژی)
پیش نمایش صفحه اول مقاله
Modelling high-resolution electron microscopy based on core-loss spectroscopy
چکیده انگلیسی

There are a number of factors affecting the formation of images based on core-loss spectroscopy in high-resolution electron microscopy. We demonstrate unambiguously the need to use a full nonlocal description of the effective core-loss interaction for experimental results obtained from high angular resolution electron channelling electron spectroscopy. The implications of this model are investigated for atomic resolution scanning transmission electron microscopy. Simulations are used to demonstrate that core-loss spectroscopy images formed using fine probes proposed for future microscopes can result in images that do not correspond visually with the structure that has led to their formation. In this context, we also examine the effect of varying detector geometries. The importance of the contribution to core-loss spectroscopy images by dechannelled or diffusely scattered electrons is reiterated here.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Ultramicroscopy - Volume 106, Issues 11–12, October–November 2006, Pages 1001–1011
نویسندگان
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