کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
1679066 1009995 2008 7 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
New approach for the dynamical simulation of CBED patterns in heavily strained specimens
موضوعات مرتبط
مهندسی و علوم پایه مهندسی مواد فناوری نانو (نانو تکنولوژی)
پیش نمایش صفحه اول مقاله
New approach for the dynamical simulation of CBED patterns in heavily strained specimens
چکیده انگلیسی
A new method for the dynamical simulation of convergent beam electron diffraction (CBED) patterns is proposed. In this method, the three-dimensional stationary Schrödinger equation is replaced by a two-dimensional time-dependent equation, in which the direction of propagation of the electron beam, variable z, stands as a time. We demonstrate that this approach is particularly well-suited for the calculation of the diffracted intensities in the case of a z-dependent crystal potential. The corresponding software has been developed and implemented for simulating CBED patterns of various specimens, from perfect crystals to heavily strained cross-sectional specimens. Evidence is given for the remarkable agreement between simulated and experimental patterns.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Ultramicroscopy - Volume 108, Issue 5, April 2008, Pages 426-432
نویسندگان
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