کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
1679147 | 1518373 | 2006 | 7 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Characterization of a single molecular QCA cell by Q-control enhanced amplitude modulation atomic force microscopy
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
مهندسی مواد
فناوری نانو (نانو تکنولوژی)
پیش نمایش صفحه اول مقاله
چکیده انگلیسی
Major technical challenges for reduction of device sizes for computation and memory are the interconnection and power dissipation problems. Molecular quantum-dot cellular automata (QCA) have been proposed as solutions to this problem. Silicon phthalocyanine (SiPc) is a possible candidate for a molecular QCA element. Therefore, it is important to develop an in situ observation technique to visualize individual SiPc molecules. We report here the first image of a single SiPc dimer in air by using quality factor control (Q-control) enhanced amplitude modulation atomic force microscopy (AFM) and an investigation of the interaction forces between the tip and SiPc dimer. The AFM was operated at 0% relative humidity in an ultrapure nitrogen environment either with or without Q-control. Theoretical simulations using the point-mass description of the AFM, demonstrated that Q-enhancement reduced the force exerted from the tip to the sample surface. Our results, consistent with theory, demonstrated that the image force was reduced and a greater height and a larger size were measured. The advantages of this method can be extended to the AFM observation of other “soft” structures, and these results can be useful for a wider community.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Ultramicroscopy - Volume 106, Issues 8â9, JuneâJuly 2006, Pages 735-741
Journal: Ultramicroscopy - Volume 106, Issues 8â9, JuneâJuly 2006, Pages 735-741
نویسندگان
I. Lee, V. Sarveswaran, M. Lieberman, E. Greenbaum,